ESREF 2022

Abstract

Product-Reliability is meeting customers’ expectations throughout expected use time. The Modern product/component Reliability are based on the physics including degradations, statistics, and the stress/mission profile the component or design will experience.

The different in the past methods and the modern reliability will be discussed. A view why MTBF seems to survive, due to lack of understanding the modern field data analysis method.

The method discussed will make it possible to have the important dialog with the management to understand the impact of poor reliability and the necessary priorities that always shall be done in a company.
The methods discussed here closes the reliability learning loop from setting up the Reliability Goal, following up during the Design Phases, Production Phases and the values can be compared with Field Failures. The method is based on the Physics of Failure parameters, Weibull, Mean Cumulative Function, and this make it possible to estimate Warranty cost, which can be transformed to Standard Unit Cost and make it possible to optimize the total product cost. You will have the opportunity to try some of the methods discussed yourself after the tutorial.

Biography

Peter de Place Rimmen is today Reliability Advisor / Specialist at RRC.dk in Denmark. He had 10 years in Danfoss Drives from 2009 to 2019. His experience is coming from a total 47 years with R&D or Quality. Totally 7 years as designer, 10 years with management and during the last 30 years Peter has worked with practical approach implementing Reliability in followed companies: Vestas Wind System R&D from 2004 to 2009, Grundfos Management from 1997 to 2004 and Bang & Olufsen R&D from 1988 to 1997. Before that, he had careers at B&O as a constructor, Test engineer, Plant manager and Project manager. Peter had for some time participated in IEC dependability group. Peter has together with Nokia trained Nokia R&D and Vestas R&D people around the world in “Design for Quality and Reliability.”
Today Peter is participating in “CORPE” Centre of Reliable Power Electronics at Aalborg University, taught at the PhD Reliability Course and 2th Master Class at Aalborg University and at SDU (South Danish University) in modern reliability, 4 years participated in ZVEI “Facts Sheets Group for Robustness Validation”, board member FAST (Danish Society for Applied Statistics) from 2003 to 2016 and initiated in 2001 and member of the Danish Six Sigma ERFA-group, subgroup of FAST. Member of the Danish Reliability Group (SPM-6) since 1988 until 2019.

Abstract

The susceptibility to cosmic rays of semiconductor power devices is becoming a real concern in many applications due to the significant impact the terrestrial cosmic radiation has on the devices’ reliability. This tutorial aims to summarize the latest results achieved by research in the study of cosmic ray effects. In particular, the spectrum of Earth’s cosmic radiation and the ways in which cosmic rays interact with power devices will be described. The main experimental techniques to characterize the cosmic ray tolerance of power devices will be presented. Finally, the relationship between the reliability of power devices and the results of the studies about their tolerance to cosmic rays will be illustrated.

Biography

Giovanni Busatto has been full professor of Power Electronics at the University of Cassino ad Southern Lazio, Italy, since 2001. He previously served as associate professor at the University of Naples “Federico II” and formerly as researcher at the Italian National Research Council. He has covered various positions of responsibility at the University of Cassino and has been responsible for projects in collaboration with leading companies in the field of power electronics. His recent research interests include the design and construction of switching power converters and the modeling, simulation and experimental characterization of power devices operating at the edge of their safe operating area and in harsh environments with a focus on cosmic radiation induced instabilities.