ESREF 2022

33rd European Symposium on Reliability of Electron
Devices Failure Physics and Analysis

September 26-29, 2022

Welcome to ESREF 2022 in Berlin!

ESREF 2022, the 33rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, will take place in Berlin (Germany) from September 26-29, 2022 at the H4 Hotel Berlin Alexanderplatz.

This international symposium continues to focus on the newest developments and future prospects for quality and reliability management of materials, devices, and circuits for micro-, nano-, and optoelectronics. It provides a European forum for all aspects of reliability management and innovative analytical techniques for present and future electronic applications.


Prof. Dr.-Ing. Martin Schneider Ramelow

Director of Research Centre for Microperipheric Technologies at TU Berlin
and Director of Fraunhofer Institute for Reliability and Microintegration IZM, Berlin

A word from the Conference Chairs

We are delighted to host the ESREF 2022 in Berlin. After a long period of online events and social distancing, we are in good hope that this event will enable us to meet in person again and to share and promote new ideas longer lasting electronics. This is an important contribution to our society, because an increased lifetime will help to reduce CO2-emissions in electronics production and recycling. But reliability also enables electronics to be used in new applications in extremely harsh environments like space, transport, energy conversion and smart functions. Also this will help us to adress main future societal challenges. A special emphasis will be given on networking: The conference will be the ideal place to establish, reinvigorate and strengthen your contacts with scientists and engineers from all over the world. To make it easier to join us from abroad all session will be streamed live for online viewing.


A - Assessment Techniques and Methods for Devices and Systems

Design for reliability; built-in reliability; virtual qualification; advanced seliability simulation; limits to accelerated tests; screening methods; yield/reliability relationship; counterfeit detection on system level; KI based reliability assessment; condition monitoring; multi-objective reliability assessment techniques; including sustainability aspects in the assessment; …

B - Semiconductor and Nanoelectronics Technologies

Process-related issues, passivation stability; hot carriers injection, NBTI, TDDB; high-K dielectrics and gate stacks; Low-K dielectrics and Cu interconnects; metal migration: mechanical and thermal aspects; non-volatile and programmable cells; silicon on insulator devices; nano-electronics, nano-electronic materials for solid state devices; …

C - Progress in Failure Analysis Methods

Electron, ion and optical beam techniques; scanning probe techniques; static or dynamic techniques, back-side techniques; acoustic microscopy; electric or magnetic field based techniques; electrical, thermal and thermo-mechanical characterization; sample preparation, construction analysis; failure analysis: case studies; Identification of counterfeits; …

D - Microwave Devices and Circuits

Microwave and compound semiconductor devices; devices for 5G communication; radar sensors; …

E - Packaging and Assemblies

E1 – Wafer- and Panel-Level

Interconnection Technologies First level interconnects; 3D-integration and through-silicon-vias; PCB-embedding, fan-out and chip-scale packaging; chip/package interaction; …

E2 – Second-Level Interconnects

Solder and high-temperature interconnects; sinterinterconnects; wire-bonds; …

F - Power Devices and Systems

F1  – Smart Power Devices, IGBT, Thyristors

F2 – Wide Bandgap Power Devices

F3  – Power Electronic Systems

G - Photonics Devices

Solar cells and display; optoelectronics; organic electronics: OLED, electronic ink, TFT

H - MEMS and Sensors

Bio-electronics, bio-sensors, nano-bio-technologies; MEMS and MOEMS; NEMS and nano-objects; …

I - Extreme Environments and Radiation

ESD-EOS, latchup; EMC-EMI (integrated circuits, power electronic systems); radiation impact on circuits and systems reliability



H4 Hotel Berlin Alexanderplatz


Monday, September 26, 2022

Tutorials, Opening Cermony, Keynotes, Exhibition Opening and Reception

Tuesday, September 27, 2022

Sessions, Exhibition, Poster Session

Wednesday, September 28, 2022

Sessions, Exhibition, Poster Session, Conference Dinner

Thursday, September 29, 2022

Sessions, Exhibition, Poster Session

Friday, September 30, 2022

Guided Technical Tours


ESREF 2022 Conference will be hosted in the conference center of the H4 Hotel in Berlin Alexanderplatz. It is located directly near the historic city center at a walking distance. The location offers a multitude of different travel options and different hotels at different budget levels are available on site (H4 and H2 Hotel) and others can be found at a walking distance.


Conference Chair

Martin Schneider-Ramelow, TU Berlin and Fraunhofer IZM (D)

Conference Co-Chairs

Andreas Middendorf, Fraunhofer IZM (D)
Olaf Wittler, Fraunhofer IZM (D)

Technical Program Chairs

Francesco Iannuzzo, University of Aalborg (DK)
Frank Altmann, Fraunhofer IMWS Halle (D)
Matteo Meneghini, University of Padova (I)
François Marc, University of Bordeaux (F)
Olaf Wittler, Fraunhofer IZM Berlin (D)

Industrial Advisory Board Chair

Stefan Wagner, Fraunhofer IZM (D)

Tutorial Chair

Gudrun Feix, ECPE, Nürnberg (D)

Conference Office

Martina Creutzfeldt, mcc Agentur für Kommunikation GmbH (D)
Ajda Omrani, mcc Agentur für Kommunikation GmbH (D)
Stefan Ast, Fraunhofer IZM (D)


F. Altmann, Fraunhofer IMWS-CAM (D)
M. Bafleur, LAAS-CNRS (F)
A. Bensoussan, TAS (F)
C. Boit, TUB – Tech. University of Berlin (D)
G. Busatto, University of Cassino (I)
M. Ciappa, ETH, Zürich (CH)
O. Crepel, AIRBUS (F)
Y. Danto, IMS, University of Bordeaux (F)
I. de Wolf, IMEC (B)
G. Erikson, GRUNDFOS (DK)
F. Fantini, University of Modena (I)
Ph. Galy, ST Microelectronics (France)
W. Gerling, ECPE (D)
R. Heiderhoff, University of Wuppertal (D)
F. Iannuzzo, University of Aalborg (DK)
N. Labat, IMS, University of Bordeaux (F)
J.R. Lloyd, University of Albany (USA)
F. Marc IMS, University of Bordeaux (F)
M. Meneghini, University of Padova (I)
E. Miranda, University Autonoma Barcelona (E)
E. Olthof, NXP Semiconductors (NL)
G. Papaioannou, University of Athens (G)
Ph. Perdu, ANADEF (F)
C. Salm, University of Twente (NL)
A. Toubul, IMS, University of Bordeaux (F)
M. Vanzi, University of Cagliari (I)
W. Wondrak, Daimler Chrysler (D)


Conference Office ESREF 2022
mcc Agentur für Kommunikation
Ajda Omrani & Martina Creutzfeldt
+49 30 61288611

Local Organizing Team ESREF 2022
Fraunhofer IZM
Stefan Ast
+49 30 46403-137