ESREF 2022

33rd European Symposium on Reliability of Electron
Devices Failure Physics and Analysis

September 26-29, 2022

Monday, 26/Sept/2022

9:00am –  11:00am Tutorial 2- Model-based Hierarchical Reliability Analysis
9:30am –
1:00pm
Tutorial 1- Introduction to the Modern Reliability Based on Physics and Statistics
11:30am –
1:00pm
Tutorial 3- Influence of Cosmic Radiation on Power Semiconductor Reliability
3:00pm –
5:00pm
Opening and Keynotes
5:00pm – 7:00pm Exhibition Opening & Welcome Reception

 

Tuesday, 27/Sept/2022

9:00am –
10:40am
A1: Mission Profiles, Modeling and Testing
Chair: Edgar Olthof
Chair: Johannes Jaeschke
F1 Smart Power Devices, IGBT and MOSFETS
Chair: Chiara Corvasce
Chair: Mauro Ciappa
10:40am – 
11:20am
Coffee Break & Exhibition
11:20am – 
1:00pm
A 2 – Reliability Assessment of Complex Systems and Underlying Technologies
Chair: Edgar Olthof
Chair: Cora Salm
D Microwave Devices and Circuits
Chair: Nathalie LABAT
Chair: Michael Dammann
1:00pm – 
2:00pm
Lunch & Exhibition
2:00pm – 
3:40pm
E1 Wafer- and Panel-Level Interconnection Technologies F2 SiC Device Reliability
Chair: Eckart Hoene
Chair: Loic THEOLIER
3:40pm 4:20pm
Coffee Break & Exhibition
4:20pm – 
6:00pm
E1 & E2 Interconnects F2 GaN Device Reliability
Chair: Eckart Hoene
Chair: Loic THEOLIER

 

Wednesday, 28/Sept/2022

9:00am –
10:40am
B Modern Memory Technologies and Thermomigration Modelling
Chair: Alain Bravaix
Chair: Eckhard Langer
F3 Power Electronic Systems 1
Chair: Olivier CREPEL
Chair: Hong Li
10:40am – 
11:20am
Coffee Break & Exhibition
11:20am – 
1:00pm
B Aging in Device Technologies
Chair: Alain Bravaix
Chair: Eckhard Langer
F3 Power Electronic Systems 2
Chair: Hong Li
Chair: Olivier CREPEL
1:00pm – 
2:00pm
Lunch & Exhibition
2:00pm – 
3:40pm
C Progress in Failure Analysis Methods
Chair: Giovanna Mura
Chair: Pascal GOUNET
E2 Second-Level Interconnects
3:40pm 4:00pm
Coffee Break & Exhibition
4:00pm – 5:30pm Poster Session
7:00pm – 
11:00pm
Conference Dinner at Wasserwerk

 

Thursday, 29/Sept/2022

9:00am –
10:40am
H MEMS and Sensors
Chair: George Papaioannou
I Extreme Environments and Radiation I
Chair: Tristan Dubois
Chair: Ruediger Hild
10:40am – 
11:20am
Coffee Break & Exhibition
11:20am – 
1:00pm
G Reliability of Light Emitters and Solar Cells
Chair: Yannick Deshayes
Chair: Massimo Vanzi
I Extreme Environments and Radiation II
Chair: Ruediger Hild
Chair: Tristan Dubois
1:00pm – 
2:00pm
Lunch & Exhibition